
Advantage:
1.High smoothness2.High lattice matching (MCT)
3.Low dislocation density
4.High infrared transmittance
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Advantage:
1.High smoothness
Properties:
Item
2 inch
4H N-type
Diameter
2inch (50.8mm)
Thickness
350+/-25um
Orientation
off
axis 4.0˚ toward <1120> ± 0.5˚
Primary
Flat Orientation
<1-100> ± 5°
Secondary
Flat
90.0˚
CW from Primary Flat ± 5.0˚,
Si Face up
Primary
Flat Length
16 ± 2.0
Secondary
Flat Length
8 ± 2.0
Grade
Production
grade (P)
Research
grade (R)
Dummy
grade (D)
Resistivity
0.015~0.028 Ω·cm
<
0.1 Ω·cm
<
0.1 Ω·cm
Micropipe
Density
≤
1 micropipes/ cm²
≤
1 0micropipes/ cm²
≤
30 micropipes/ cm²
Surface
Roughness
Si
face CMP Ra <0.5nm, C Face Ra <1 nm
N/A,
usable area > 75%
TTV
<
8 um
<
10um
<
15 um
Bow
< ±8 um
< ±10um
< ±15um
Warp
<
15 um
<
20 um
<
25 um
Cracks
None
Cumulative
length ≤ 3 mm
Cumulative
length ≤10mm,
Scratches
≤
3 scratches, cumulative
≤
5 scratches, cumulative
≤
10 scratches, cumulative
Hex
Plates
maximum
6 plates,
maximum
12 plates,
N/A,
usable area > 75%
Polytype
Areas
None
Cumulative
area ≤ 5%
Cumulative
area ≤ 10%
Contamination
None
Orientation
on
the edge
single
length ≤
2mm
length
< 1* diameter
length
< 2* diameter
length
< 5* diameter
<100um
<300um
LaAlO3 Substrate
MgO Substrate
BaTiO3 Substrate
SrTiO3 Substrate
KTaO3 Substrate
CdTe Substrate
LSAT Substrate
BSO Crystal
BGO Crystal
MgAl2O4 Substrate
Ge Substrate
LiAlO2 Substrate