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| Property | Value | Measurement Method |
|---|---|---|
| Substrate Dimensions | 10 mm x 10 mm | Caliper Measurement |
| Thickness | 500 µm | Micrometer |
| Orientation | (001) | X-ray Diffraction |
| Surface Roughness | 0.5 nm | Atomic Force Microscopy |
| Crystal Quality | High Quality | FWHM Measurement |
| Thermal Conductivity | 25 W/m·K | Laser Flash Analysis |